For nearly two decades, two-dimensional (2D) semiconductors have been studied as a complement or possible successor to silicon transistors, promising smaller, faster and more energy-efficient ...
Duke engineers show how a common device architecture used to test 2D transistors overstates their performance prospects in real-world devices.
A stunning new imaging breakthrough lets scientists see — and fix — the atomic flaws hiding inside tomorrow’s computer chips.
Lab architecture used to test 2D semiconductors artificially boosts performance metrics, making it harder to assess whether these materials can truly replace silicon.
The research 'Impact of Contact Gating on Scaling of Monolayer 2D Transistors Using a Symmetric Dual-Gate Structure' appeared online February 17 2026 in ACS Nano from the lab of Aaron Franklin, a ...
Researchers used advanced electron ptychography to visualize atomic-scale defects inside modern transistors. The technique ...
For nearly two decades, two‑dimensional (2D) semiconductors have been studied as a complement or possible successor to silicon transistors, promising ...
When a videogame wants to show a scene, it sends the GPU a list of objects described using triangles (most 3D models are broken down into triangles). The GPU then runs a sequence called a rendering ...
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Tiny thermometers offer on-chip temperature monitoring for processors
The semiconductor chips driving modern-day computer processors are covered in billions of individual transistors, each of ...
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Electron microscopy shows 'mouse bite' defects in semiconductors
Cornell researchers have used high-resolution 3D imaging to detect, for the first time, the atomic-scale defects in computer chips that can sabotage their performance. The imaging method, which was ...
Adding big blocks of SRAM to collections of AI tensor engines, or better still, a waferscale collection of such engines, turbocharges AI inference, as has ...
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